Automated Cosmetic Defect Check to launch at MWC 2018

By January 30, 2018News, Press Releases

Automated Cosmetic Defect Check, the latest addition to our suite of patented products, will make its global debut at the Mobile World Congress (MWC) trade show on February 26 – March 1, 2018.

This new tool is designed to assess the condition of mobile phones and smart electronic devices at the point of return. Utilizing a combination of artificial intelligence (AI) and our proprietary machine-learnt algorithm, it ushers objectivity – a hallmark of the Diagnostics tool for internal hardware diagnosis – into the grading of exterior cosmetic surface damage.

Pervacio’s founder and CEO Sanjay Kanodia will be attending Mobile World Congress to discuss our latest technology developments.

He says: “Mobile World Congress is widely regarded as the mobile industry’s most prestigious event, so it’s an ideal platform for us to launch our latest automation tool.

“We’ll be underlining the seamless, end-to-end device management capability that all the tools across our Revolution platform deliver, and will be talking to companies across the retail and supply chain industries to explain how they can benefit from these advanced technological innovations.”

By imaging a device on all sides Automated Cosmetic Defect Check can establish the definitive cosmetic condition of any given device, identifying everything from minor cosmetic imperfections to those heavily damaged devices requiring complete external refurbishment.

Our tools deliver a unified and impartial device assessment platform across the entire reverse supply chain. By removing human subjectivity our customers are able to realize significant operational efficiencies and, ultimately, reduce the costs associated with the return and trade-in of cosmetically damaged devices.

Full details about our new Automated Cosmetic Defect Check tool, will be available at Mobile World Congress on stand CS70, Congress Square.